| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 545941 | Microelectronics Reliability | 2008 | 6 Pages |
Abstract
As device dimensions are scaled down, single event transients (SET) are increasingly affecting the reliability of integrated circuits. An SET is a transient voltage perturbation caused by an energetic particle strike at the semiconductor. This work studies the applicability of bulk built in current sensors (bulk-BICS) for SET detection in deep-submicron technologies. The bulk-BICS detects the transient current generated by the impact of an energetic particle at a sensitive circuit node. The efficiency and applicability of this approach to SET detection is demonstrated through device and circuit level simulations.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Gilson Wirth,