Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
546003 | Microelectronics Reliability | 2007 | 8 Pages |
Abstract
Density functional theory is the method of choice in theoretical materials science. It has also proved to be a useful tool in device engineering, particularly at nanoscale and when novel materials are involved. In this paper, we briefly review recent theoretical results in the area of the advanced gate stack materials engineering.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Alexander A. Demkov, Onise Sharia, Xuhui Luo, Jaekwang Lee,