| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 546077 | Microelectronics Reliability | 2006 | 7 Pages |
Abstract
Reliability of semiconductor lasers used in recent systems and equipment is reviewed from an aspect of the degradation mechanisms. The degradation mechanisms clarified for last three decades still govern the reliability though the operating conditions of the lasers and requirements to the lasers are quite severe as the application fields diffuse widely. Based on the mechanisms, the laser reliability is briefly discussed for new application including future systems.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Mitsuo Fukuda,