X-ray ion mobility spectrometer

Ion mobility spectrometer with X-ray ionization source (X-IMS) is examined in this paper. The investigation of X-ray radiation source (X-source) using in ion mobility spectrometer has been fulfilled. In comparison with other ionization sources X-ray lamp has some advantages such as: low cost, low energy consumption, small size, high reliability and safety. The parameters of X-source have been extracted: reactant ion generation coefficient and reactant ion recombination coefficient. The experimental data concerning ion current is presented. The experimental explosive ions spectra have been obtained.