| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 546198 | Microelectronics Reliability | 2006 | 4 Pages |
Abstract
We have achieved a greater than 2.5× improvement in the acquisition time figure of merit of an EmiScope™ Time Resolved photon Emission (TRE)-based probe system, by optimization of the detector dark-count rate, photon detection efficiency, and timing jitter. The effects of detector after-pulsing were reduced by use of an optimized hold-off time.
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