| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 546259 | Microelectronics Reliability | 2006 | 6 Pages |
Abstract
Based on the on-state voltage drop monitoring at high current, an alternative method for thermo-sensitive parameters calibration is reported. The main goal is that it allows the simultaneous calibration of the series resistance and power devices voltage drop on temperature. Thereby, the average temperature over all power devices and the temperature difference in average inside the pack can be measured in real applications.
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