Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
546288 | Microelectronics Reliability | 2006 | 10 Pages |
Abstract
An on-chip electrostatic discharge (ESD) protection scheme is demonstrated for an emerging technology of microelectromechanical systems (MEMS)-based embedded sensor (ES) system-on-a-chip (SoC). The ESD protection scheme is implemented using ground-referenced multifinger thyristor-type devices optimized for (1) the input/output (I/O) protection, (2) the power supply clamp, and (3) the internal sensors’ electrodes during the micromachining process. The ESD structure developed demonstrates a leakage current below 10−10 A, high on-state conductance, and high level of human body model (HBM) immunity.
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Authors
Javier A. Salcedo, Juin J. Liou, Muhammad Y. Afridi, Allen R. Hefner Jr.,