Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
546378 | Microelectronics Journal | 2010 | 9 Pages |
Abstract
This paper focuses on modeling and characterizing the data dependent jitter (DDJ) in high-speed interconnect. The analysis process is performed based on the Fourier series using the interconnect RLC model. By calculating the pattern dependent delay deviations, the DDJ is characterized. To validate the model accuracy, the analysis results have been compared against Cadence simulations. The interconnect layout optimization is also explored to minimize the DDJ.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Tian Xia, Di Mu,