Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
546498 | Microelectronics Reliability | 2007 | 5 Pages |
Abstract
Experimental results on thermally induced degradation tests carried out at the relatively low ageing temperatures less than 200 °C in NTC ceramic thermistors based on mixed transition-metal manganites (Cu,Ni,Co,Mn)3O4 are discussed. It is first established that, despite of chemical composition and technological features of the investigated ceramics, the stretched-exponential relaxation function of DeBast–Gillard or Williams–Watts is the unique analytical expression describing kinetics of the observed degradation processes.
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Authors
V.O Balitska, B Butkievich, O.I Shpotyuk, M.M Vakiv,