Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
547025 | Microelectronics Reliability | 2012 | 5 Pages |
Abstract
A novel power-clamp assisted complementary MOSFET (PCACMOS), modified from traditional gate-coupled complementary MOSFET (GCCMOS), is proposed for high robust ESD (Electrostatic discharge) protection application. The power-clamp achieves by RC-NMOS and designs by Spice simulation. The comprehensive performance of the protection schemes are evaluated by the figure of merit (FOM). Compared with traditional gate-coupled MOSFET (GCCMOS) protection scheme, the power-clamp assisted complementary MOSFET (PCACMOS) protection scheme has a similar turn-on speed but higher FOM.
Related Topics
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Authors
Jian Wu, Shurong Dong, Mingliang Li, Meng Miao, Fei Ma, Jianfeng Zheng, Yan Han,