| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 547126 | Microelectronics Reliability | 2012 | 5 Pages |
The experimental analysis of the electrical behavior of Phase Change Memory arrays evidenced a seasoning effect both on SET and RESET state. The previous modeling efforts on this issue were addressed only towards RESET operation. This work presents a SET seasoning model implemented within a numerical simulator starting from the extraction of the characteristic Erase operation kinetic parameters, in order to complete the picture of seasoning modeling in PCM. The analysis of such phenomenon, that is not detrimental to the memory, allows a better comprehension of the transition dynamics from the amorphous to the crystalline phase. The model developed reproduces experimental data obtained with writing waveforms featuring different crystallization approaches.
