Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
547255 | Microelectronics Journal | 2014 | 7 Pages |
•Analysis of the intrinsic limitations of a low-frequency noise experimental set-up.•Analysis of transimpedance amplifiers as tools for noise characterization.•Noise characterization.•Noise modeling.•Guidelines for robust and reliable electrical characterization of noise phenomena.
An experimental set-up for the characterization of low-frequency noise on two terminal devices is reported. The experimental set-up is based on the use of the commercial transimpedance amplifier (TA) EG&G5182. This paper addresses the influence of the TA on the noise characterization process by describing the TA as a non-ideal operational amplifier with a feedback resistor. The impact of the TA finite input resistance and voltage gain is highlighted through comparison with measurements carried out on resistors and diodes.
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