| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 547425 | Microelectronics Reliability | 2011 | 4 Pages |
Abstract
Suppose a device is subjected to a sequence of shocks occurring randomly in time according to a homogeneous Poisson process. In this paper we introduce a class of non-monotonic aging distributions, the so-called New Worse then Better than Used in Failure Rate (NWBUFR) and New Worse then Better than Average Failure Rate (NWBAFR). It is shown under appropriate conditions on the probability of surviving a given number of shocks that the non-monotonic aging classes NWBUFR and NWBAFR arise from suitable Poisson shock models.
Related Topics
Physical Sciences and Engineering
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Hardware and Architecture
Authors
Aniruddha Pandey, Murari Mitra,