Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
547583 | Microelectronics Reliability | 2007 | 6 Pages |
Abstract
This paper discusses the commonly accepted method for life-time prediction for power converters in traction. The method is based on junction temperature estimation and thermal cycles on a given duty cycle. The predicted numbers of thermal cycles are compared to the curves giving the number of cycles to failure versus temperature cycles. These curves are extrapolated from power cycling tests. Power cycling tests and extrapolation method will be discussed, particularly under the aspect of failure mechanisms that are induced. In order to generate the same failure mechanisms in power cycling than in the real applications, a new power cycling approach is presented.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
M. Mermet-Guyennet, X. Perpiñá, M. Piton,