Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
547599 | Microelectronics Reliability | 2007 | 5 Pages |
Abstract
This work examines the thermal fatigue effects on the temperature distribution inside IGBT modules for aeronautical applications. Exactly, they are used in a very different application where temperature cycling due to the working environment is the most limiting fact. In this case, it is concluded that solder delamination does not present any restriction to module lifetime at short term (up to 60% of total delaminated area). In addition, it is proposed only determining the delaminated area behind devices, which is the main responsible of the thermal temperature increase.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
T. Lhommeau, X. Perpiñà, C. Martin, R. Meuret, M. Mermet-Guyennet, M. Karama,