| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 547609 | Microelectronics Reliability | 2007 | 5 Pages |
Abstract
The reconfigurability of SRAM-based FPGAs has also some drawbacks, especially when used in systems requiring a high level of safety and/or dependability. Dealing with single-event effects is an important issue in these systems. This paper presents a software tool to analyze a bit-stream and the functional effects of errors in it. Results of analyzes are presented, based on experiments using a laser platform to inject faults in the circuit.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
V. Maingot, J.B. Ferron, R. Leveugle, V. Pouget, A. Douin,