Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
547683 | Microelectronics Reliability | 2007 | 7 Pages |
Abstract
This paper discusses several aspects of the performance of advanced Si-based RF transistors. The RF performance of SiGe HBTs and Si RF MOSFETs is reviewed and compared to that of III–V RF transistors. The speed – breakdown voltage tradeoff which is typical for bipolar transistors is discussed with special emphasis on SiGe HBTs. On the field-effect transistor side, we review the performance of state-of-the-art Si RF MOSFETs and show that these devices are highly competitive in terms of speed and cutoff frequency.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
F. Schwierz, C. Schippel,