Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
547925 | Microelectronics Journal | 2008 | 5 Pages |
Abstract
GaN nanowires have been successfully synthesized on Si(1 1 1) substrate by ammoniating Ga2O3 films at 950 °C. The structure and morphology of GaN nanowires are characterized by X-ray diffraction, scanning electron microscopy, field-emission transmission electron microscope and X-ray photoelectron spectroscopy. The results show that the synthesized nanowires are single-crystal hexagonal wurtzite GaN with diameters ranging from 50 to 100 nm and lengths up to several microns. Finally, the growth mechanism of GaN nanowires is explored.
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Authors
Hui-Zhao Zhuang, Bao-Li Li, Cheng-Shan Xue, Xiao-kai Zhang, Shi-Ying Zhang, De-Xiao Wang, Jia-Bing Shen,