Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
548306 | Microelectronics Reliability | 2010 | 9 Pages |
Abstract
The uncertainty analysis of ball grid array (BGA) fatigue life for the global–local modeling would be discussed. For the Monte Carlo simulation the various input parameters, both material property and geometric dimensions, are assumed to have a normal distribution. The major observations became most evident during an uncertainty analysis where it was recognized that the input parameters were not fixed known values, but nominal values or “best guesses” that a designer or engineer would input to the model either from an existing product or a design yet to be built. Such nominal values or “best guesses” could be slightly different than the actual values of the final product.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Mei-Ling Wu, Donald Barker,