Article ID Journal Published Year Pages File Type
548450 Microelectronics Reliability 2007 8 Pages PDF
Abstract

For ESD protections of RF Power MOSTs, Vt1 lowering by the RF signal – due to the dV/dt effect – can seriously degrade the RF performance. The use of a cascoded protection solves this problem. A new failure mechanism, related to the discharge of on-chip RF matching capacitors is presented. Adding a current limiting resistor in the protection solves this issue. Combining these solutions yields an appropriate protection for discrete RF power LDMOSTs.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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