Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
548450 | Microelectronics Reliability | 2007 | 8 Pages |
Abstract
For ESD protections of RF Power MOSTs, Vt1 lowering by the RF signal – due to the dV/dt effect – can seriously degrade the RF performance. The use of a cascoded protection solves this problem. A new failure mechanism, related to the discharge of on-chip RF matching capacitors is presented. Adding a current limiting resistor in the protection solves this issue. Combining these solutions yields an appropriate protection for discrete RF power LDMOSTs.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
T. Smedes, J. de Boet, T. Rödle,