Article ID Journal Published Year Pages File Type
548451 Microelectronics Reliability 2007 8 Pages PDF
Abstract

The present work is focussed on the trade-off between conventional RF ESD protection concepts optimized in terms of capacitive load and the frequently discussed RF ESD codesign idea with ESD protection skilfully integrated into RF circuit design. A narrow and a broadband RF test circuit were developed to put the benchmark on a firm basis. RF and ESD experiments are discussed, showing where the higher effort for the codesign approach starts to pay off.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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