| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 548452 | Microelectronics Reliability | 2007 | 9 Pages |
Abstract
This paper investigates on the transient pulse response of the device under test, which is becoming a critical aspect in determining the ESD reliability of a variety of technology products. For the first time, the feasibility to calibrate or tune the artifacts arising out of system parasitic to ‘see’ the device transient response is presented in this paper with experimental data and numerical analysis.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
D. Trémouilles, S. Thijs, Ph. Roussel, M.I. Natarajan, V. Vassilev, G. Groeseneken,