Article ID Journal Published Year Pages File Type
548561 Microelectronics Reliability 2006 12 Pages PDF
Abstract

There is a trend to revive mature technologies while including high voltage options. ESD protection in those technologies is challenging due to narrow ESD design windows, NMOS degradation problems and the creation of unexpectedly weak parasitic devices. Different case studies are presented for ESD protection based on latch-up immune SCR devices.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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