| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 548588 | Microelectronics Reliability | 2006 | 10 Pages |
Abstract
Finite element analysis is also performed to explain the experimental observations. All the observations can be well explained by the charging effect of the solder masks. The charging effect of solder mask is indeed very significant in affecting the image contrast, and it could reduce the contrast to almost zero in some cases.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Cher Ming Tan, Zhenghao Gan, Tai Chong Chai,