Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project

•A new research activity which mixes EMC and IC reliability.•We study the effect of IC aging its electromagnetic behavior.•Experimental methodology to qualify IC EMC drifts after aging.•Link between on-chip degradation mechanisms and EMC drifts.•Methodology to predict long-term electromagnetic robustness.

This paper presents the scientific achievements of EMRIC project that aimed at developing a new research activity which mixes EMC and IC reliability. This project contributes to improve the electromagnetic robustness (EMR) of integrated circuits over the full life-time of the electronic system, with a special emphasis on deep submicron technology. The results of this project give a unique overview about EMR in the scientific community and will contribute to develop EMR qualification procedures, EMR design techniques and EMR predictive methods.