| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 549084 | Microelectronics Reliability | 2013 | 5 Pages |
•Relability, femtosecond laser, data storage, optical memory.•The robustness is specifically study on numerical data storage.•The advance building reliability is engage on new fundamental design.
Thermal stress at 100 °C for more than 3168 h of a fluorescent optical memory composed of laser written silver nano clusters embedded in glass has been performed. Measurements of luminescence spectra have been carried out at different times, showing a decreasing and an increasing evolution of the red and the blue part of the spectrum, respectively. This evolution has been attributed to the diffusion and the reorganization of different silver species inside the matrix, altering the internal electric field. Stark effect based modeling enables the degradation mode of the memory.
