| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 549089 | Microelectronics Reliability | 2013 | 5 Pages |
Abstract
•Trans-characteristics : the monitor current vs. laser voltage in a laser module.•They are shown to carry detailed information on the behavior of the active region.•Trans-characteristics are coupled with EBIC to study some laser burnout cases.•Basic concepts in laser diode theory are discussed, as gain and efficiency.
Current and/or photon crowding are indicted as a risk factor for high modulation speed laser diodes. A prompting field failure case is complemented with detailed the analysis of the DC measurements, highlighting the role of the transcharacteristics, and EBIC mapping.
Related Topics
Physical Sciences and Engineering
Computer Science
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Authors
G. Mura, M. Vanzi, G. Marcello, R. Cao,