| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 549279 | Microelectronics Reliability | 2012 | 10 Pages |
In this work, we present ball impact test (BIT) responses and fracture modes obtained at an impact velocity of 0.8 m/s on SAC (Sn–Ag–Cu) package-level solder joints with a trace amount of Mn or RE (rare earth) additions, which were bonded with substrates of OSP Cu and electroplated Ni/Au surface finishes respectively. With respect to the as-mounted conditions, the Ni/Au joints possessed better impact fracture resistance than those with Cu substrate. Subsequent to aging at 150 °C for 800 h, multi-layered intermetallic compounds emerged at the interface of the Ni/Au joints and gave rise to degradation of the BIT properties. This can be prevented by RE doping, which is able to inhibit the growth of interfacial IMCs during aging. As for aged Cu joints, the Mn-doped samples showed the best performance in impact force and toughness. This was related to the hardened Sn matrix, and most importantly, a greater Cu3Sn/Cu6Sn5 thickness ratio at the interface. Compared to Cu6Sn5, Cu3Sn with a similar hardness but greater elastic modulus possessed better plastic ability, which was beneficial to the reliability of solder joints suffering high strain rate deformation if no excess Kirkendall voids formed.
