Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
549567 | Microelectronics Reliability | 2009 | 7 Pages |
Abstract
A novel “plug-and-play” ESD protection methodology for wideband RF applications is demonstrated. This methodology, referred to as T-diodes, utilizes an integrated transformer together with classical ESD protection diodes. The T-diodes act as an artificial transmission line that, when placed as a “plug-and-play” ESD protection component in front of an unprotected wideband LNA, preserves the input matching of that LNA. As a demonstrator, a wideband RF LNA in 0.18 μm CMOS is protected above 4.5 kV HBM ESD robustness without degrading its bandwidth.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
D. Linten, S. Thijs, J. Borremans, M. Dehan, D. Trémouilles, M. Scholz, M.I. Natarajan, P. Wambacq, Stefaan Decoutere, G. Groeseneken,