| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 549571 | Microelectronics Reliability | 2009 | 6 Pages |
Abstract
The CDM failure threshold of microelectronic components are determined by the peak value of the discharge current. The requirements of the market, however, are given in terms of potential. In addition, it is not known how the CDM susceptibility of an IC is affected by its core circuitry. This paper introduces an idea how CDM protection concepts can be checked by tests on an interface test chip to guarantee satisfying product qualifications.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Tilo Brodbeck, Kai Esmark, Wolfgang Stadler,