Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
549573 | Microelectronics Reliability | 2009 | 8 Pages |
Abstract
The research was aimed on defining a factor of quality for high-voltage varistors using Non-Destructive Testing (NDT) techniques, which could be applied during the production testing. The newly proposed parameter Q determined on the basis of the lowest resonant frequency fr measured within the preselected frequency range was taken into account. The parameter Q was defined for ZnO structures after firing, without metallized contacts. The results of investigations allow to conclude that the parameter Q can be used as the quality factor for high-voltage varistors classification into groups of differentiated quality.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Lech Hasse, Alicja Konczakowska, Janusz Smulko,