Article ID Journal Published Year Pages File Type
549638 Microelectronics Reliability 2009 7 Pages PDF
Abstract

The dimensions of discrete passives, passive integrated components (arrays, networks) and embedded integral ones should be reduced significantly in the nearest future. Therefore the relations between technological accuracy and limitations, minimal geometrical dimensions and electrical as well as stability properties become more and more important. This paper presents systematic studies of thick-film or LTCC microresistors made with the aid of laser shaping. The investigations are concerned with miniaturization of two resistor dimensions, namely length (down to 30 μm) and width (also down to 30 μm). The sheet resistance, hot temperature coefficient of resistance (HTCR) as well as long-term stability and durability of test structures to various short electrical pulses were related to geometrical properties of microresistors. Such investigations proved that combining of current materials and fabrication methods used in modern thick-film and LTCC technologies with laser shaping made possible fabrication of 30 × 30 μm2 microresistors with satisfactory electrical properties and can serve as interesting alternative for thick-film and LTCC resistors miniaturization.

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Physical Sciences and Engineering Computer Science Hardware and Architecture
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