Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
549760 | Microelectronics Reliability | 2007 | 11 Pages |
Abstract
The study aims at developing a reliable procedure for evaluating the performance of TFT–LCD monitors in drop circumstances during transportation, as well as improving their shock resistance by design modification. The effective simulation model is completed by comparing with experimental verification through less severe drop laboratory for obtaining more effective data. Drop shock-induced transient phenomena are extensively discussed. To effectively improve the product for fulfilling the IEC drop-test regulations, three component modifications are proposed and verified. The applied approaches can even be broadened to other TFT–LCD products.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Min-Chun Pan, Po-Chun Chen,