| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 549798 | Microelectronics Reliability | 2006 | 4 Pages |
Abstract
The complex thermal impedance Zth of a microelectronic heat source on the surface of a silicon wafer has been calculated semi-analytically as a function of the frequency. By representing the results in a Nyquist plot, almost perfect circular curves are obtained. This result is analogous to complex loci of the dielectric constant obtained for some materials.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
B. Vermeersch, G. De Mey,