Article ID Journal Published Year Pages File Type
6903736 Applied Soft Computing 2018 10 Pages PDF
Abstract
Bayesian inference integrating Gibbs sampling and Cohen's kappa coefficient is developed for analyzing semiconductor big data for yield enhancement and smart production in real settings.
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Related Topics
Physical Sciences and Engineering Computer Science Computer Science Applications
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Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0
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