Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6945483 | Microelectronics Reliability | 2018 | 8 Pages |
Abstract
The method is demonstrated with a representative mid-power LED. The results are validated with steady-state FEA. Suppressed estimation errors of the heat path evaluation are indicated.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A. Alexeev, G. Martin, G. Onushkin,