Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6945504 | Microelectronics Reliability | 2018 | 7 Pages |
Abstract
This paper deals with Potential Induced Degradation (PID) of p-type monocrystalline PV modules (Evergreen) from a photovoltaic power plant that has been in operation mode for 7â¯years. Within the PV module affected by the PID degradation, the effect of the electric field on individual PV cells is studied. The distribution of the electric field was simulated by SolidWorks software. The results show a random distribution of affected PV cells not related to the size and distribution of the electric field intensity. Furthermore, the dependencies of negative voltage potential on the range of PID degradation of individual PV modules located in the negative pole of the PV string is made. From measured current voltage characteristics (measured at STC), it is evident that the value of negative voltage potential is not directly proportional to the PID occurrence. These results are supplemented by electroluminescence images which confirm this finding.
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Authors
Josef Hylský, Dávid Strachala, Petr Vyroubal, Pavel Äudek, JiÅà VanÄk, Petr Vanýsek,