| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6945607 | Microelectronics Reliability | 2018 | 10 Pages |
Abstract
Repetitive pulse load was applied for selected samples. The results show that resistors exhibited very good stability after test with 0.1 million pulses with amplitude of 70% of critical electric field intensity values.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Arkadiusz DÄ
browski, Andrzej Dziedzic,