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Study of electrochemical migration based transport kinetics of metal ions in Sn-9Zn alloy

Article ID Journal Published Year Pages File Type
6945689 Microelectronics Reliability 2018 8 Pages PDF
Keywords
tinelectronic packagingFinite element methodZincSEMNernst-Planck equation
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Preview
Study of electrochemical migration based transport kinetics of metal ions in Sn-9Zn alloy
Authors
Haoran Ma, Anil Kunwar, Jun Chen, Lin Qu, Yunpeng Wang, Xueguan Song, Peter RÃ¥back, Haitao Ma, Ning Zhao,
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Microelectronics Reliability
Journal: Microelectronics Reliability
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