Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6945896 | Microelectronics Reliability | 2018 | 8 Pages |
Abstract
(a) Forward and (b) reverse dark J-V curves for three substrings of module 2. (c) Forward and (d) reverse dark J-V curves for three substrings of module 3. The dark J-V curves were measured at room temperature. The J-V curves for substrings of the module are normalized in voltage based on a single cell.292
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Hardware and Architecture
Authors
He Wang, Pan Zhao, Hong Yang, Jipeng Chang, Dengyuan Song, Shiyu Sang,