| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6945955 | Microelectronics Reliability | 2018 | 9 Pages |
Abstract
Impact of a single charge on Vt of Nanowire Î fet & Finfet from 3D electrostatic simulations.153
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Xavier Garros, Antoine Laurent, Alexandre Subirats, X. Federspiel, E. Vincent, Gilles Reimbold,