Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946087 | Microelectronics Reliability | 2017 | 5 Pages |
Abstract
Dual diodes with embedded silicon controlled rectifier (DD-SCR) for high-speed applications are presented. A new DD-SCR topography is shown to exhibit a high failure current (It2), small on-state resistance (RON), low voltage overshoot and low parasitic capacitance. This is a preferred device option for broadband high-speed data converter applications in advanced 28Â nm CMOS processes. A comprehensive device characterization demonstrates the design tradeoffs and the superior ESD performance in relation to the devices' variations capacitance in the sub 40Â fF range.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou,