Article ID Journal Published Year Pages File Type
6946112 Microelectronics Reliability 2017 9 Pages PDF
Abstract
Direct bonded copper (DBC) are produced by high temperature ( >1000 ° C) bonding between copper and a ceramic (usually alumina). They are commonly used in power electronics. However, their reliability when exposed to thermal cycling is still an issue, that could be addressed by advanced numerical simulations. This paper describes the identification of the parameters for a numerical model that uses finite elements with cohesive zones. This identification is based on careful mechanical characterization of all components of the DBC (ceramic, copper and interface) using an innovative approach based on image correlation.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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