Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946478 | Microelectronics Reliability | 2015 | 5 Pages |
Abstract
This paper presents the main features of modeling, but it shows their implementation on a real HPRA test in Load Short Circuit (LSC) condition. Modeling allows result prediction at a temperature for which a test has not been performed, but it allows also a full explanation of the phenomena: for example, it enables to estimate activation energy of acceleration factor in the test, but also the failure mechanisms at the breakage origin. This paper highlights the necessary conditions for the tests so that interpretation may be complete and significant.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
C. Bergès, Y. Weber, P. Soufflet,