| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6946491 | Microelectronics Reliability | 2015 | 6 Pages |
Abstract
We developed a high-throughput screening tester for DBC-module of IGBT. The tester realizes a new screening test with current distribution in addition to a conventional switching test. It consists of a power circuit, a replaceable test head, sensor array module and digitizer with LabVIEW program. Therefore, all kinds of DBC-modules can be screened by switching the test head. The tester acquires magnetic field signals and displays GO/NOGO judgment automatically after digital calibration and signal processing in 10Â s. It is expected to be applied for screening in a production line and analysis in order to prevent the failure of power modules.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
M. Tsukuda, H. Tomonaga, S. Okoda, R. Noda, K. Tashiro, I. Omura,