Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool

METIS, SIMPA and PROFIT are engineer tools based on heavy ion cross section for the assessment of Single Event Upsets induced by protons. Whereas SIMPA and PROFIT were based on analytical models; METIS has the particularity to rely on Monte-Carlo simulations of nuclear reactions and simple assumptions for upset triggering. Such tools are very useful for end-users because no information about the technology is needed to perform the sensitivity prediction, not even the feature size. The work presents the prediction results achieved on sub-100 nm technology SRAMs and SDRAMs with METIS and compares them with the ones obtained using SIMPA and PROFIT, widely applied for space radiation environment. METIS gives much more accurate results than the former analytical models.