| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6946648 | Microelectronics Reliability | 2015 | 5 Pages |
Abstract
Dynamic photon emission is an efficient tool for timing analysis of various areas. However, advances in transistors integration bring more complex test patterns and more objects to investigate. As a consequence, understanding the analyzed area and finding nodes of interest can be difficult. In this paper, a method for drawing synthesis of the various signals met inside an area is reported. It is based on unsupervised learning tool for dimension reduction and clustering. The process is applied to real data to show its efficiency and its quality is evaluated.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
S. Chef, S. Jacquir, K. Sanchez, P. Perdu, S. Binczak, C.L. Gan,