Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946677 | Microelectronics Reliability | 2015 | 6 Pages |
Abstract
This paper will detail the possibilities given by the magnetic imaging to observe this kind of defect in conditions where the basic use would normally be unable to, since a capacitive and/or an inductive device would blind it. A test vehicle has been realized in order to evaluate this new use of the magnetic imaging. Finally, a piezo-actuator component is then studied in order to prove the concept.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
N. Courjault, P. Perdu, F. Infante, T. Lebey, V. Bley,