Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946740 | Microelectronics Reliability | 2014 | 4 Pages |
Abstract
This empirical evaluation delivers a different view on the I(t)-trace shapes leading to better understanding of its contributions to the TDDB behavior.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
O. Aubel, A. Beyer, G. Talut, M. Gall,