Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946877 | Microelectronics Reliability | 2014 | 8 Pages |
Abstract
An interpretation of the phenomenon is given that attributes such spike to a strong current imbalance on the large area device, so that a latch-up failure mechanism is proposed.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
C. Abbate, F. Iannuzzo, G. Busatto, A. Sanseverino, F. Velardi, C. Ronsisvalle, J. Victory,